Reliability, yield, and stress burn-in : a unified approach for microelectronics systems manufacturing & software development
Title:
Reliability, yield, and stress burn-in : a unified approach for microelectronics systems manufacturing & software development
JLCTITLE245:
by Way Kuo, Wei-Ting Kary Chien, Taeho Kim.
Personal Author:
Publication Information:
Boston, Mass : Kluwer Academic Publishers, c1998.
Physical Description:
xxvi, 394 p. : ill. ; 24 cm.
ISBN:
9780792381075
Abstract:
Reliability, Yield, and Stress Burn-In explains reliability issues in Microelectronics Systems Manufacturing and Software Development with an emphasis on evolving manufacturing technology for the semiconductor industry. Since most microelectronics components have their infant mortality period for about one year under the ordinary operating conditions, and many of the modern systems, such as the PC's, are heavily used in the first few years, the reliability problem at the infant mortality period becomes extremely important. Burn-in is an accelerated screening procedure that eliminates early on the infant mortalities in the shop before shipping out the products to the customers. This book will also help readers to analyze systems that exhibit high failure rate during a long infant mortality period. Reliability, Yield, and Stress Burn-In presents ways to systematically analyze burn-in policy at that component, sub-system, and system levels. Various statistical methods are addressed including parametric, nonparametric, and Bayesian approaches. Many case studies are introduced in combination with the developed theories. Included in the book is an introduction to software reliability.
Bibliography Note:
Includes bibliographical references (p. [333]-361) and index.
Contents:
1. Overview of Design, Manufacture, and Reliability -- 2. Integrating Reliability into Microelectronics Manufacturing -- 3. Basic Reliability Concept -- 4. Yield and Modeling Yield -- 5. Reliability Stress Tests -- 6. Burn-in Performance, Cost, and Statistical Analysis -- 7. Nonparametric Reliability Analysis -- 8. Parametric Approaches To Decide Optimal System Burn-in Time -- 9. Nonparametric Approach and Its Applications to Burn-in -- 10. Nonparametric Bayesian Approach for Optimal Burn-in -- 11. The Dirichlet Process for Reliability Analysis -- 12. Software Reliability and Infant Mortality Period of the Bath-tub Curve -- Epilogue: Cost-effective Design for Stress Burn-in -- App. A. Notation and Nomenclature -- App. B. Failure Modes for Parts -- App. C. Common Probability Distributions -- App. D. Simulation for U-shaped Hazard Rate Curves -- App. E. Sample Programs.